MOS semiconductor memory device having charge storage region formed from stack of insulating films
a aaa a. The invention provides a MOS semiconductor memory device that achieves excellent data retention characteristics while also achieving high-speed data write performance, low-power operation performance, and high reliability. A MOS semiconductor memory device includes a first insulating film a...
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Main Authors | , , , , , |
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Format | Patent |
Language | English |
Published |
04.09.2012
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Online Access | Get full text |
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Summary: | a aaa a. The invention provides a MOS semiconductor memory device that achieves excellent data retention characteristics while also achieving high-speed data write performance, low-power operation performance, and high reliability. A MOS semiconductor memory device includes a first insulating film and fifth insulating film having large bandgaps and , a third insulating film having the smallest bandgap , and a second insulating film and fourth insulating film interposed between the third insulating film and the first and fifth insulating films and , respectively, and having intermediate bandgaps and |
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