ESD protection using a capacitivly-coupled clamp for protecting low-voltage core transistors from high-voltage outputs

• Main Authors: Kwong, Kwok Kuen David, Ng, Chik Wai David, So, Wai Kit Victor, Kwan, Hing Kit
• Format: Patent
• Language: English
• Published: 06.12.2011

An electro-static-discharge (ESD) protection circuit protects core transistors. An internal node to the gate of an n-channel output transistor connects to the drain of an n-channel gate-grounding transistor to ground. The gate of the gate-grounding transistor is a coupled-gate node that is coupled by an ESD coupling capacitor to the output and to ground by an n-channel disabling transistor and a leaker resistor. The gate of the n-channel disabling transistor is connected to power and disables the ESD protection circuit when powered. An ESD pulse applied to the output is coupled through the ESD coupling capacitor to pulse high the coupled-gate node and turn on the gate-grounding transistor to ground the gate of the n-channel output transistor, which breaks down to shunt ESD current. The ESD pulse is prevented from coupling through a parasitic Miller capacitor of the n-channel output transistor by the gate-grounding transistor.