Method for the temperature measurement of substrates, and vacuum processing apparatus

A method for measuring the temperature of substrates to be coated is disclosed. The substrates have an opening or a cavity, and the substrates are successively moved past a source of coating material. At least one substrate's temperature is measured during coating by at least one temperature se...

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Bibliographic Details
Main Authors Heisig, Andreas, Meyer, Thomas
Format Patent
LanguageEnglish
Published 06.12.2011
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Summary:A method for measuring the temperature of substrates to be coated is disclosed. The substrates have an opening or a cavity, and the substrates are successively moved past a source of coating material. At least one substrate's temperature is measured during coating by at least one temperature sensor and the measured temperature value is transmitted to a measuring device. The temperature sensor is disposed inside the substrate's opening or cavity so as to prevent coating of the temperature sensor.