Apparatus and method for supporting, positioning and rotating a substrate in a processing chamber

Embodiments of the invention contemplate a method, apparatus and system that are used to support, position, and rotate a substrate during processing. Embodiments of the invention may also include a method of controlling the transfer of heat between a substrate and substrate support positioned in a p...

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Bibliographic Details
Main Authors Koelmel, Blake, Lerner, Alexander N, Ranish, Joseph M, Sangam, Kedarnath, Sorabji, Khurshed
Format Patent
LanguageEnglish
Published 15.11.2011
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Summary:Embodiments of the invention contemplate a method, apparatus and system that are used to support, position, and rotate a substrate during processing. Embodiments of the invention may also include a method of controlling the transfer of heat between a substrate and substrate support positioned in a processing chamber. The apparatus and methods described herein remove the need for complex, costly and often unreliable components that would be required to accurately position and rotate a substrate during one or more processing steps, such as an rapid thermal processing (RTP) process, a chemical vapor deposition (CVD) process, a physical vapor deposition (PVD) process, atomic layer deposition (ALD) process, dry etching process, wet clean, and/or laser annealing process.