Photoresist systems
New photoresist systems are provided that comprise an underlying processing (or barrier) layer composition and an overcoated photoresist layer. Systems of the invention can exhibit significant adhesion to SiON and other inorganic surface layers.
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Main Authors | , |
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Format | Patent |
Language | English |
Published |
06.09.2011
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Online Access | Get full text |
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Abstract | New photoresist systems are provided that comprise an underlying processing (or barrier) layer composition and an overcoated photoresist layer. Systems of the invention can exhibit significant adhesion to SiON and other inorganic surface layers. |
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AbstractList | New photoresist systems are provided that comprise an underlying processing (or barrier) layer composition and an overcoated photoresist layer. Systems of the invention can exhibit significant adhesion to SiON and other inorganic surface layers. |
Author | Xu, Cheng-Bai Taylor, Gary N |
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References | Barclay et al. (6306554) 20011000 Zampini et al. (6503689) 20030100 Montgomery et al. (6605394) 20030800 Oberlander et al. (2003/0129531) 20030700 Shao et al. (6080530) 20000600 Hacker et al. (4760013) 19880700 Pavelchek et al. (6261743) 20010700 Zampini et al. (6576681) 20030600 Puligadda et al. (2003/0065164) 20030400 Shao et al. (2002/0045125) 20020400 Trefonas et al. (2002/0031729) 20020300 Chiong (4904564) 19900200 Pavelchek et al. (6190839) 20010200 Thackeray et al. (5851730) 19981200 Adams et al. (6602652) 20030800 Puligadda et al. (6323310) 20011100 Shih et al. (2003/0129542) 20030700 Pavelchek et al. (6316165) 20011100 Puligadda et al. (6524708) 20030200 Taylor et al. (2003/0228474) 20031200 Shao et al. (5935760) 19990800 Meador et al. (6156479) 20001200 Shao et al. (6042990) 20000300 (WO 02/086624) 20021000 Bruhnke et al. (6048662) 20000400 Taylor et al. (2002/0055061) 20020500 Nemoto et al. (5525457) 19960600 Flaim et al. (5693691) 19971200 Adams et al. (6410209) 20020600 Zampini et al. (6599951) 20030700 Sinta et al. (6033830) 20000300 Pavelchek et al. (2002/0022196) 20020200 Wayton et al. (2003/0180559) 20030900 Pavelchek et al. (6653049) 20031100 Thackeray et al. (6528235) 20030300 Mao et al. (2002/0028408) 20020300 Teng et al. (2003/0219603) 20031100 Takei et al. (6444320) 20020900 |
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