Method of testing PRAM device

A method of testing PRAM devices is disclosed. The method simultaneously writes input data to a plurality of memory banks by writing set data to a first group of memory banks and writing reset data to a second group of memory banks, performs a write operation test by comparing data read from the plu...

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Bibliographic Details
Main Authors Lee, Chang-Soo, Oh, Hyung-Rok, Cho, Beak-Hyung, Lee, Kwang-Jin
Format Patent
LanguageEnglish
Published 06.07.2010
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Summary:A method of testing PRAM devices is disclosed. The method simultaneously writes input data to a plurality of memory banks by writing set data to a first group of memory banks and writing reset data to a second group of memory banks, performs a write operation test by comparing data read from the plurality of memory banks with corresponding input data, and determines a fail cell in relation to the test results.