Real-time optimized testing of semiconductor device

A method and system for testing a semiconductor device is disclosed. The method provides an integrated test program defined by a plurality of test items, and a test program defined by a sub-set of the test items. Test data is derived by batch sample testing of the semiconductor device, and an error...

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Bibliographic Details
Main Authors Chung, Ae-yong, Lee, Hwa-cheol, Cho, Se-rae, Shin, Kyeong-seon
Format Patent
LanguageEnglish
Published 30.03.2010
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Summary:A method and system for testing a semiconductor device is disclosed. The method provides an integrated test program defined by a plurality of test items, and a test program defined by a sub-set of the test items. Test data is derived by batch sample testing of the semiconductor device, and an error rate for a test item is computed and then compared to a reference data value. On the basis of the comparison between the error rate and the reference data value, the test program may be modified in real-time.