Analog set top calibration patterns in manufacturing

Included are systems and methods for performing a functionality test to an STT. At least one embodiment of a method includes storing at least one test pattern in a storage device, decoding the at least one stored test pattern, and sending the test pattern from a output port to an input port, the inp...

Full description

Saved in:
Bibliographic Details
Main Authors Montreuil, Leo, Williams, Wayne B, Russ, Samuel H, Kriete, Robert A
Format Patent
LanguageEnglish
Published 03.03.2009
Online AccessGet full text

Cover

More Information
Summary:Included are systems and methods for performing a functionality test to an STT. At least one embodiment of a method includes storing at least one test pattern in a storage device, decoding the at least one stored test pattern, and sending the test pattern from a output port to an input port, the input port being coupled to at least one tuning device. Other embodiments include tuning, via the at least one tuning device, the STT according to the test pattern and converting the decoded test pattern to at least one output signal.