Methods and apparatus for testing a component

A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan d...

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Bibliographic Details
Main Authors Suh, Ui Won, Gambrell, Gigi Olive, Ertel, John William, McKnight, William Stewart
Format Patent
LanguageEnglish
Published 14.10.2008
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Summary:A method for inspecting a component. The method includes generating a scan plan of a component to be inspected, coupling a side-mount probe to an eddy current inspection system, inducing an eddy current into the component, measuring the eddy current in the component to generate a plurality of scan data, and analyzing the scan data to generate at least one image of the component being inspected.