Integrated optoelectronic system for measuring fluorescence or luminescence emission decay

An optoelectronic system for measuring fluorescence or luminescence emission decay, including (a) a light source being a light emitting diode, a semiconductor laser or a flash tube; (b) a first integrated circuit comprising at least one circuit causing the light source to emit light pulses towards a...

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Bibliographic Details
Main Authors Fouquet, Julie E, Hardcastle, Ian, Helbing, Rene P, Grot, Annette C, Petrilla, John Francis
Format Patent
LanguageEnglish
Published 24.06.2008
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Summary:An optoelectronic system for measuring fluorescence or luminescence emission decay, including (a) a light source being a light emitting diode, a semiconductor laser or a flash tube; (b) a first integrated circuit comprising at least one circuit causing the light source to emit light pulses towards a sample which causes a fluorescence or luminescence emission from the sample; (c) a photodiode detecting the emission; (d) a second integrated circuit comprising a detection analysis system determining information about the sample by analyzing decay of the detected emission; and (e) an enclosure enclosing the light source, the first integrated circuit, the second integrated circuit and the photodiode.