Extended input/output measurement block

An Input/output (I/O) measurement block facility is provided that creates subchannel measurement blocks (comprising device busy values) related to performance of an I/O operation of a subchannel, wherein a device busy time value is a sum of time intervals when the subchannel is device busy during an...

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Bibliographic Details
Main Authors Carlson, Scott M, Dyck, Greg A, Lu, Tan, Oakes, Kenneth J, Riedy, Jr, Dale F, Rooney, William J, Trotter, John S, Wyman, Leslie W, Yudenfriend, Harry M
Format Patent
LanguageEnglish
Published 13.05.2008
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Summary:An Input/output (I/O) measurement block facility is provided that creates subchannel measurement blocks (comprising device busy values) related to performance of an I/O operation of a subchannel, wherein a device busy time value is a sum of time intervals when the subchannel is device busy during an attempt to initiate any one of a start function or a resume function at the subchannel.