Method for programming and/or testing for correct functioning of an electronic circuit

Proposed is a method for programming and/or testing for the correct functioning of an electronic circuit, and a corresponding device, which is used to efficiently program and test electronic circuits combined on a wafer, prior to their separation. For this purpose, a bus allowing the individual elec...

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Bibliographic Details
Main Authors Giesel, Ruediger, Seifert, Dieter, Wolf, Rene, Henne, Ralf
Format Patent
LanguageEnglish
Published 14.08.2007
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Summary:Proposed is a method for programming and/or testing for the correct functioning of an electronic circuit, and a corresponding device, which is used to efficiently program and test electronic circuits combined on a wafer, prior to their separation. For this purpose, a bus allowing the individual electronic circuits to be sequentially tested is positioned on the wafer. Each electronic circuit is assigned an address for the bus, using a hardware code. The address is deactivated after completion of the functionality and testing method.