Test system

A test system has a test controller and at least one probe. An ICC card (C) is inserted into a slot of the probe, and a card-simulating interface of the probe is inserted in the slot (S) of the terminal (T) under test. The test controller communicates bi-directionally with the terminal (T) and an ex...

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Bibliographic Details
Main Authors Corcoran, Aidan Ivor, Hilliard, Robert C
Format Patent
LanguageEnglish
Published 03.07.2007
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Summary:A test system has a test controller and at least one probe. An ICC card (C) is inserted into a slot of the probe, and a card-simulating interface of the probe is inserted in the slot (S) of the terminal (T) under test. The test controller communicates bi-directionally with the terminal (T) and an external transaction processing system (B). Up to six data monitoring points ( to ) are possible, different numbers of points providing different modes of operation.