Method for VLSI system debug and timing analysis

A method for characterizing circuit activity in an IC. Generally, the method comprises the steps of activating an IC, resolving the switching activity in space and time, and generating a representation of the switching behavior which differentiates the time that circuits or transistors switch. One e...

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Bibliographic Details
Main Authors Chase, Harold W, Knebel, Daniel R, Menzer, Dennis G, Polonsky, Stanislav, Sanda, Pia N
Format Patent
LanguageEnglish
Published 26.09.2006
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Summary:A method for characterizing circuit activity in an IC. Generally, the method comprises the steps of activating an IC, resolving the switching activity in space and time, and generating a representation of the switching behavior which differentiates the time that circuits or transistors switch. One embodiment of the invention, utilizes a method such as, but not limited to, time resolved photon emission to observe transistor level switching activity in an integrated circuit (IC).