Dual probe assembly for a printed circuit board test apparatus

• Main Authors: Parshotam, Mahesh P, Graverholt, James M, Howard, Alan D
• Format: Patent
• Language: English
• Published: 15.08.2006

The dual probe assembly is used with a printed circuit board test apparatus. It includes a first, satellite test probe holder for a first, satellite test probe and a motor for rotating the first test probe holder. It further includes a second, main test probe holder for a second, main test probe and...