Dual probe assembly for a printed circuit board test apparatus

The dual probe assembly is used with a printed circuit board test apparatus. It includes a first, satellite test probe holder for a first, satellite test probe and a motor for rotating the first test probe holder. It further includes a second, main test probe holder for a second, main test probe and...

Full description

Saved in:
Bibliographic Details
Main Authors Parshotam, Mahesh P, Graverholt, James M, Howard, Alan D
Format Patent
LanguageEnglish
Published 15.08.2006
Online AccessGet full text

Cover

More Information
Summary:The dual probe assembly is used with a printed circuit board test apparatus. It includes a first, satellite test probe holder for a first, satellite test probe and a motor for rotating the first test probe holder. It further includes a second, main test probe holder for a second, main test probe and a motor for moving the second test probe holder. The first test probe holder can move without affecting the position of the second test probe, while the second test probe holder is connected to the first test probe holder in such a manner that movement of the second test probe holder moves the first test probe holder, wherein both a selected distance between the two test probes and a selected angular orientation therebetween can be achieved.