Method of manufacturing a semiconductor component that includes self-aligning a gate electrode to a field plate
In one embodiment of the invention, a semiconductor component includes a semiconductor substrate, a first dielectric layer above the semiconductor substrate, a first ohmic contact region and a second ohmic contact region above the semiconductor substrate, a gate electrode above the semiconductor sub...
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Main Authors | , , , , , , |
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Format | Patent |
Language | English |
Published |
06.09.2005
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Online Access | Get full text |
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Summary: | In one embodiment of the invention, a semiconductor component includes a semiconductor substrate, a first dielectric layer above the semiconductor substrate, a first ohmic contact region and a second ohmic contact region above the semiconductor substrate, a gate electrode above the semiconductor substrate and between the first ohmic contact region and the second ohmic contact region, a field plate above the first dielectric layer and between the gate electrode and the second ohmic contact region, a second dielectric layer above the field plate, the first dielectric layer, the first ohmic contact region, and the second ohmic contact region, and a third dielectric layer between the gate electrode and the field plate and not located above the gate electrode or the field plate. |
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