Method and apparatus for detecting boron in x-ray fluorescence spectroscopy

• Main Author: Platonov, Yuriy
• Format: Patent
• Language: English
• Published: 13.07.2004

The present invention relates to a multilayer structure for reflecting x-ray radiation and an associated method for analyzing the atomic or molecular composition of a sample through x-ray fluorescence spectroscopy. The present invention consists of a multilayer structure having at least one triad of layers where each of the three layers is a predetermined material. One of the materials is from a group including lanthanum, lanthanum oxide, or lanthanum-based alloys. A second material is disposed between the first material and a third material. The second material is from a group including carbon, silicon, boron, boron carbide or silicon carbide. The third material is from a group including boron or boron carbide. Alternatively, a fourth material is added to further strengthen and increase the water resistance of the multilayer structure. The fourth material is selected from a group including silicon, boron, boron carbide or silicon carbide. The fourth material is disposed between the third layer of multilayer period n and the first layer of multilayer period n−1.