Multidimensional contact mechanics measurement system

• Main Authors: Lucas, Barry N, Hay, Jr., John C
• Format: Patent
• Language: English
• Published: 04.11.2003

The present invention is generally directed to an apparatus for conducting contact mechanics measurements in multiple dimensions. More particularly, the invention is directed to a system for coupling three orthogonal one-dimensional force and displacement measuring systems for conducting contact mechanics measurements on a surface, where forces on the surface in any two orthogonal directions resulting from the application of a force in the third direction are minimized. A multidimensional surface mechanics measurement system applies forces to a surface while minimizing coupling between the forces so applied. The system includes first, second, and third elongate members, a coupler for coupling the elongate members together, and a probe connected to the coupler having a contact point for contacting the surface. The first elongate member extends in a first axial direction that is substantially normal to the surface, the second elongate member extends in a second axial direction that is substantially orthogonal to the first axial direction, and the third elongate member extends in a third axial direction that is substantially orthogonal to the first and second axial directions. Desired relationships between the free length and diameter, and between the axial stiffness and transverse stiffness, and the orthogonal relative positioning of the elongate members, minimizes cross-talk between the measurement axes while maintaining the necessary structural rigidity.