Ion filling control in ion trap mass spectrometers
From dozens of publications, it has been know that the ion traps of both ion cyclotron resonance and quadrupole high frequency ion-trap mass spectrometers should not be filled with ions beyond a certain limiting value, as otherwise the ion cloud will have a noticeable effect on the oscillation behav...
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| Main Authors | , |
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| Format | Patent |
| Language | English |
| Published |
29.07.2003
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| Online Access | Get full text |
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| Summary: | From dozens of publications, it has been know that the ion traps of both ion cyclotron resonance and quadrupole high frequency ion-trap mass spectrometers should not be filled with ions beyond a certain limiting value, as otherwise the ion cloud will have a noticeable effect on the oscillation behavior of the ions being detected or ejected and detection via resonance absorption or resonance ejection will therefore cease to yield the correct mass determination.
The invention relates to the control of the filling process of an ion trap with ions in order to avoid the deteriorating effect of too many stored ions on the quality of the spectrum during a mass scan. In the prior art, the "number of ions" inside the ion trap were used to contol filling. However, controlling the number of ions does not provide optimum trap filling for different ion compositions. The invention overcomes the problem by controlling a mass-dependent physical parameter and applying an cluster-dependent target value. This method takes into account the mass-dependency of optimum ion filling as well as the effect of non-uniform distribution of ions of different mass-to-charge ratios over the mass spectrum. |
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