Method and apparatus for exercising external memory with a memory built-in test
The present invention relates to the field of network communications, and more particularly, to the testing of an external system memory of a network interface controller. A network interface controller with an external memory is provided with memory built-in self-test (MBIST) logic that exercises t...
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Format | Patent |
Language | English |
Published |
15.04.2003
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Online Access | Get full text |
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Summary: | The present invention relates to the field of network communications, and more particularly, to the testing of an external system memory of a network interface controller.
A network interface controller with an external memory is provided with memory built-in self-test (MBIST) logic that exercises the memory subsystem. The memory testing is run at normal operating speed to test normal and worst-case access patterns. By adjusting a memory size register and running the MBIST test with different sizes, the actual size of the memory is determined. |
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