Confocal microscope and wide field microscope
The present application claims the benefit of Japanese Patent Application No. 2000-013622 which is hereby incorporated by reference. A confocal microscope for observing the image of an object to be observed by scanning a spot light for illuminating the object through an objective lens, comprises an...
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| Format | Patent |
| Language | English |
| Published |
10.09.2002
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| Online Access | Get full text |
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| Summary: | The present application claims the benefit of Japanese Patent Application No. 2000-013622 which is hereby incorporated by reference.
A confocal microscope for observing the image of an object to be observed by scanning a spot light for illuminating the object through an objective lens, comprises an aperture stop for adjusting the numerical aperture of the objective lens; and a control unit for calculating a contrast of the image of the object corresponding to each focal position while varying the focal position of the objective lens along the direction of the optical axis so as to determine the height of the unevenness on the surface of the object from a change of the contrast, thereby setting the aperture stop to have the focal depth substantially equal to the height of the unevenness. |
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