Connection terminals and manufacturing method of the same, semiconductor device and manufacturing method of the same

A first protection film ( 3 ) and a second protection film ( 4 ) are formed on an electrode pad ( 2 ). Bumps ( 5 ) are formed at sites where the deposited first and second protection films ( 3 ), ( 4 ) are both removed. The openings ( 3 a ) where the lower, first protection film ( 3 ) is removed are...

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Bibliographic Details
Main Authors Ono, Atsushi, Asazu, Takuro, Yamaguchi, Shinji
Format Patent
LanguageEnglish
Published 30.10.2003
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Summary:A first protection film ( 3 ) and a second protection film ( 4 ) are formed on an electrode pad ( 2 ). Bumps ( 5 ) are formed at sites where the deposited first and second protection films ( 3 ), ( 4 ) are both removed. The openings ( 3 a ) where the lower, first protection film ( 3 ) is removed are larger than the openings ( 4 a ) where the upper, second protection film ( 4 ) is removed, so that the upper, second protection film ( 4 ) has an overhanging structure. The bottom periphery of the bump ( 5 ) is formed to extend under the second protection film ( 4 ).