A study of failure mechanisms in CMOS & BJT ICs and their effect on device reliability

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Bibliographic Details
Published inProceedings of 2nd International Conference on Reliability, Safety and Hazard - ICRESH 2010 p. 425
Main Authors Rajesh, M.G., Vinod, Gopika, Das, D., Bhatnagar, P.V., Pithawa, C.K., Thaduri, Adithya, Verma, Ajit Kumar
Format Conference Proceeding
LanguageEnglish
Published 2010
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ISBN:1424483441
9781424483440
DOI:10.1109/ICRESH.2010.5779587