Triethanolamine doped multilayer MoS2 field effect transistorsElectronic supplementary information (ESI) available. See DOI: 10.1039/c7cp00589j

Chemical doping has been investigated as an alternative method of conventional ion implantation for two-dimensional materials. We herein report chemically doped multilayer molybdenum disulfide (MoS 2 ) field effect transistors (FETs) through n-type channel doping, wherein triethanolamine (TEOA) is u...

Full description

Saved in:
Bibliographic Details
Main Authors Ryu, Min-Yeul, Jang, Ho-Kyun, Lee, Kook Jin, Piao, Mingxing, Ko, Seung-Pil, Shin, Minju, Huh, Junghwan, Kim, Gyu-Tae
Format Journal Article
LanguageEnglish
Published 24.05.2017
Online AccessGet full text

Cover

Loading…
More Information
Summary:Chemical doping has been investigated as an alternative method of conventional ion implantation for two-dimensional materials. We herein report chemically doped multilayer molybdenum disulfide (MoS 2 ) field effect transistors (FETs) through n-type channel doping, wherein triethanolamine (TEOA) is used as an n-type dopant. As a result of the TEOA doping process, the electrical performances of multilayer MoS 2 FETs were enhanced at room temperature. Extracted field effect mobility was estimated to be ∼30 cm 2 V −1 s −1 after the surface doping process, which is 10 times higher than that of the pristine device. Subthreshold swing and contact resistance were also improved after the TEOA doping process. The enhancement of the subthreshold swing was demonstrated by using an independent FET model. Furthermore, we found that the doping level can be effectively controlled by the heat treatment method. These results demonstrate a promising material system that is easily controlled with high performance, while elucidating the underlying mechanism of improved electrical properties by the doping effect in a multilayered scheme. As a result of the TEOA doping process, the electrical performances of multilayer MoS 2 FETs were enhanced at room temperature.
Bibliography:10.1039/c7cp00589j
Electronic supplementary information (ESI) available. See DOI
ISSN:1463-9076
1463-9084
DOI:10.1039/c7cp00589j