Spatial resolution and cathodoluminescence intensity dependence on acceleration voltage in electron beam excitation assisted optical microscopy using Y 2 O 3 :Eu 3+ film

This study presents relationship between acceleration voltage and spatial resolution of electron-beam assisted (EXA) optical microscope. The nanometric illumination light sources of the present EXA microscope was red-emitting cathodoluminescence (CL) in the Y O :Eu thin film excited by focused elect...

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Bibliographic Details
Published inUltramicroscopy Vol. 182; p. 212
Main Authors Masuda, Yu, Kamiya, Masashi, Sugita, Atsushi, Inami, Wataru, Kawata, Yoshimasa, Kominami, Hiroko, Nakanishi, Yoichiro
Format Journal Article
LanguageEnglish
Published Netherlands 01.11.2017
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Summary:This study presents relationship between acceleration voltage and spatial resolution of electron-beam assisted (EXA) optical microscope. The nanometric illumination light sources of the present EXA microscope was red-emitting cathodoluminescence (CL) in the Y O :Eu thin film excited by focused electron beam. Our experimental results demonstrated that the spatial resolutions of the EXA microscope were higher as the acceleration voltage was higher. We managed to make images of the scattered gold particles with approximately 90 nm-resolutions at the voltages higher than 20 kV. The dependence of the spatial resolution on the acceleration voltage was explained by the distribution of simulated electron scattering trajectories in the luminescent thin film.
ISSN:1879-2723