Integrated chip-scale Si 3 N 4 wavemeter with narrow free spectral range and high stability

We designed, fabricated, and characterized an integrated chip-scale wavemeter based on an unbalanced Mach-Zehnder interferometer with 300 MHz free spectral range. The wavemeter is realized in the Si N platform, allowing for low loss with ∼62  cm of on-chip delay. We also integrated an optical hybrid...

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Bibliographic Details
Published inOptics letters Vol. 41; no. 14; p. 3309
Main Authors Xiang, Chao, Tran, Minh A, Komljenovic, Tin, Hulme, Jared, Davenport, Michael, Baney, Doug, Szafraniec, Bogdan, Bowers, John E
Format Journal Article
LanguageEnglish
Published United States 15.07.2016
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Summary:We designed, fabricated, and characterized an integrated chip-scale wavemeter based on an unbalanced Mach-Zehnder interferometer with 300 MHz free spectral range. The wavemeter is realized in the Si N platform, allowing for low loss with ∼62  cm of on-chip delay. We also integrated an optical hybrid to provide phase information. The main benefit of a fully integrated wavemeter, beside its small dimensions, is increased robustness to vibrations and temperature variations and much improved stability over fiber-based solutions.
ISSN:1539-4794