On the Role of the NaN super(+) Junction Doping Profile of a PIN Diode on Its Turn-Off Transient Behavior
This paper focuses on the role of the N-N junction doping profile model of a PiN diode on its turn-off transient and, particularly, the influence of multiple epitaxies in the N-N profile. A conventional doping profile model has been used in a previous work and an identification procedure for the mai...
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Published in | IEEE transactions on power electronics Vol. 23; no. 1 |
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Main Authors | , , , , , |
Format | Journal Article |
Language | English |
Published |
01.01.2008
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Subjects | |
Online Access | Get full text |
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Summary: | This paper focuses on the role of the N-N junction doping profile model of a PiN diode on its turn-off transient and, particularly, the influence of multiple epitaxies in the N-N profile. A conventional doping profile model has been used in a previous work and an identification procedure for the main design parameters has been demonstrated. However the validity range of identified PiN-diode models appeared quite limited for hard current and voltage conditions. Readers have asked for the effect of a more advanced doping profile. The turn-off transient of an STTB506D device is considered from experimental and simulation point-of-view inside a fully characterized switching cell. A limitation of the conventional doping profile model is demonstrated and explained physically in order to introduce the necessity of a more complex doping profile. An advanced doping profile is then considered and a comparative study between experimental and simulated turn-off transient behavior of the device is established. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 content type line 23 ObjectType-Feature-1 |
ISSN: | 0885-8993 |
DOI: | 10.1109/TPEL.2007.911882 |