A SUMMARY OF THE ISTFA 2023 PANEL DISCUSSION: CHARGING FORWARD: NAVIGATING RELIABILITY AND FAILURES IN POWER ELECTRONICS

Zhang et al discuss the 2023 ISTFA Panel Discussion Session, which focused on the theme: Moving Toward Reliable Power Electronics. Power electronics is often the unsung hero of modern innovations such as generative AI, electric cars, solar energy harvesting, and more. And notably, the reliability of...

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Bibliographic Details
Published inElectronic device failure analysis Vol. 26; no. 1; p. 37
Main Authors Zhang, Chuan, Hendarto, Erwin, Parente, Renee
Format Magazine Article
LanguageEnglish
Published Materials Park Electronic Device Failure Analysis Society 01.02.2024
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Summary:Zhang et al discuss the 2023 ISTFA Panel Discussion Session, which focused on the theme: Moving Toward Reliable Power Electronics. Power electronics is often the unsung hero of modern innovations such as generative AI, electric cars, solar energy harvesting, and more. And notably, the reliability of power electronic devices is crucial for not only company success but also the safety and well-being of individuals. Leading the audience through the field of reliability and failures of power electronics were four esteemed panelists. Prof. Joseph Bernstein from Ariel University, Prof. Aristos Christou from University of MD, Dr. Helmut Angerer from Infineon Technologies, and Nicholas Richardson from Wolfspeed shared their valuable insights throughout the panel discussion.
Bibliography:content type line 24
ObjectType-Feature-1
SourceType-Magazines-1
ISSN:1537-0755
2304-8115