A SUMMARY OF THE ISTFA 2023 PANEL DISCUSSION: CHARGING FORWARD: NAVIGATING RELIABILITY AND FAILURES IN POWER ELECTRONICS
Zhang et al discuss the 2023 ISTFA Panel Discussion Session, which focused on the theme: Moving Toward Reliable Power Electronics. Power electronics is often the unsung hero of modern innovations such as generative AI, electric cars, solar energy harvesting, and more. And notably, the reliability of...
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Published in | Electronic device failure analysis Vol. 26; no. 1; p. 37 |
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Main Authors | , , |
Format | Magazine Article |
Language | English |
Published |
Materials Park
Electronic Device Failure Analysis Society
01.02.2024
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Subjects | |
Online Access | Get full text |
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Summary: | Zhang et al discuss the 2023 ISTFA Panel Discussion Session, which focused on the theme: Moving Toward Reliable Power Electronics. Power electronics is often the unsung hero of modern innovations such as generative AI, electric cars, solar energy harvesting, and more. And notably, the reliability of power electronic devices is crucial for not only company success but also the safety and well-being of individuals. Leading the audience through the field of reliability and failures of power electronics were four esteemed panelists. Prof. Joseph Bernstein from Ariel University, Prof. Aristos Christou from University of MD, Dr. Helmut Angerer from Infineon Technologies, and Nicholas Richardson from Wolfspeed shared their valuable insights throughout the panel discussion. |
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Bibliography: | content type line 24 ObjectType-Feature-1 SourceType-Magazines-1 |
ISSN: | 1537-0755 2304-8115 |