Characterization of unstained multiphase polymer systems by analytical electron microscopy

• Published in: Polymer testing Vol. 23; no. 7; pp. 775 - 778
• Main Authors: Correa, C A, Bonse, B C, Chinaglia, C R, Hage Jr, E, Pessan, L A
• Format: Journal Article
• Language: English
• Published: 01.10.2004
• ISSN: 0142-9418
• DOI: 10.1016/i.polymertesting.2004.04.004

The use of analytical microscopy techniques for studying phase morphology in unstained multiphase polymer systems is presented. Energy filtering transmission electron microscope (EFTEM) images of an unstained chlorine modified polycarbonate [1:1 bisphenol-A-tetrachlorobisphenol copolycarbonate (BA-TCBA-co-PC)] blended with a styrene-acrylonitrile copolymer (SAN) were compared to backscattered electron images (BSEI) by scanning electron microscopy (SEM) and chemical element dot mapping using energy dispersive spectroscopy (EDS). Optimum contrast conditions in EFTEM were achieved by filtering out electron inelastic scattering from brightfield images (zero loss), while the chemical composition determined by the SEM was used to complement the morphological information acquired from the EFTEM analysis. Comparison of brightfield EFTEM and BSE images showed excellent agreement while element dot mapping of carbon, chlorine and oxygen presence in the sample confirmed the main morphological features determined.