The performance of the IMR three-dimensional atom probe
This paper reports the design and the performance of a three-dimensional atom probe which was recently constructed at the Institute for Materials Research, Tohoku University, Japan. The new atom probe consists of both a reflectron type time-of-flight atom probe (ToFAP) and a position sensitive atom...
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Published in | Applied surface science Vol. 87-88; pp. 453 - 459 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
11.07.1994
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Online Access | Get full text |
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Summary: | This paper reports the design and the performance of a three-dimensional atom probe which was recently constructed at the Institute for Materials Research, Tohoku University, Japan. The new atom probe consists of both a reflectron type time-of-flight atom probe (ToFAP) and a position sensitive atom probe (PoSAP). These are controlled with a CAMAC based controlling system interfaced with a Macintosh computer. The performance of the reflectron type atom probe and the position sensitive atom probe is demonstrated using a Cr-25Fe specimen. |
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Bibliography: | SourceType-Scholarly Journals-2 ObjectType-Conference Paper-1 content type line 23 SourceType-Conference Papers & Proceedings-1 ObjectType-Feature-2 ObjectType-Article-3 |
ISSN: | 0169-4332 |