Spectroscopic ellipsometry: a useful tool to determine the refractive indices and interfaces of In sub 0 sub . sub 5 sub 2 Al sub 0 sub . sub 4 sub 8 As and In sub 0 sub . sub 5 sub 3 Al sub x Ga sub 0 sub . sub 4 sub 7 sub - sub x As on InP in the wavelength range from 280 to 1900 nm

Two layers (with different thicknesses) of each composition were investigated to determine the refractive indices and exact values of thicknesses.

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Bibliographic Details
Published inThin solid films Vol. 233; no. 1-2; pp. 145 - 147
Main Authors Dinges, H W, Burkhard, H, Losch, R, Nickel, Hubertus, Schlapp, W
Format Journal Article
LanguageEnglish
Published 01.01.1993
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Summary:Two layers (with different thicknesses) of each composition were investigated to determine the refractive indices and exact values of thicknesses.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
content type line 23
ObjectType-Feature-1
ISSN:0040-6090