Interface Study of PECVD Hydrogenated Silicon Carbide Coating on Polypropylene

AES, XPS and IR studies of silicon-carbon alloys (a-Si sub x C sub 1--x :H), obtained by PECVD (plasma-enhanced chemical vapor deposition), on polypropylene reveal a Si-concentration gradient in the coating thickness whichever the gaseous composition used for the deposition. Furthermore, an adhesion...

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Bibliographic Details
Published inApplications of surface science Vol. 72; no. 4; pp. 393 - 407
Main Authors Durand, J, Meunier, C, Berjoan, R, Benhassaine, A
Format Journal Article
LanguageEnglish
Published 01.12.1993
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Summary:AES, XPS and IR studies of silicon-carbon alloys (a-Si sub x C sub 1--x :H), obtained by PECVD (plasma-enhanced chemical vapor deposition), on polypropylene reveal a Si-concentration gradient in the coating thickness whichever the gaseous composition used for the deposition. Furthermore, an adhesion zone between the isotactic polypropylene and the thin film is pointed out. Structural characterizations of this coating on isotactic polypropylene allow the formation mechanisms to be determined.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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ObjectType-Feature-1
ISSN:0378-5963