Interface Study of PECVD Hydrogenated Silicon Carbide Coating on Polypropylene
AES, XPS and IR studies of silicon-carbon alloys (a-Si sub x C sub 1--x :H), obtained by PECVD (plasma-enhanced chemical vapor deposition), on polypropylene reveal a Si-concentration gradient in the coating thickness whichever the gaseous composition used for the deposition. Furthermore, an adhesion...
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Published in | Applications of surface science Vol. 72; no. 4; pp. 393 - 407 |
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Main Authors | , , , |
Format | Journal Article |
Language | English |
Published |
01.12.1993
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Online Access | Get full text |
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Summary: | AES, XPS and IR studies of silicon-carbon alloys (a-Si sub x C sub 1--x :H), obtained by PECVD (plasma-enhanced chemical vapor deposition), on polypropylene reveal a Si-concentration gradient in the coating thickness whichever the gaseous composition used for the deposition. Furthermore, an adhesion zone between the isotactic polypropylene and the thin film is pointed out. Structural characterizations of this coating on isotactic polypropylene allow the formation mechanisms to be determined. |
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Bibliography: | ObjectType-Article-2 SourceType-Scholarly Journals-1 content type line 23 ObjectType-Feature-1 |
ISSN: | 0378-5963 |