Influence of implanted yttrium on the mechanism of growth of Cr sub 2 O sub 3 on Cr

Ion implantation of Cr with Y changes the growth mechanism from cation to anion diffusion. Segregation of Y ions to oxide grain boundaries influences transport rates.

Saved in:
Bibliographic Details
Published inJournal of the Electrochemical Society Vol. 134; no. 7; pp. 1871 - 1872
Main Authors Cotell, C M, Yurek, Gregory J, Hussey, R J
Format Journal Article
LanguageEnglish
Published 01.01.1987
Online AccessGet full text

Cover

More Information
Summary:Ion implantation of Cr with Y changes the growth mechanism from cation to anion diffusion. Segregation of Y ions to oxide grain boundaries influences transport rates.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
content type line 23
ObjectType-Feature-1
ISSN:0013-4651