Field ion microscopic observations of LaB sub(6) on tungsten

The importance of field ion microscopy as a unique surface microscopic technique has been pointed out with particular reference to the lanthanum hexaboride (LaB sub(6))-deposited refractory metal cathodes. In the core, field ion microscopic observations of LaB sub(6) deposited tungsten are described...

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Published inBulletin of materials science Vol. 6; no. 3; pp. 573 - 577
Main Authors Joag, D B, Kanitkar, P L, Kanitkar, M M, Shukla, V M
Format Journal Article
LanguageEnglish
Published 01.01.1984
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Summary:The importance of field ion microscopy as a unique surface microscopic technique has been pointed out with particular reference to the lanthanum hexaboride (LaB sub(6))-deposited refractory metal cathodes. In the core, field ion microscopic observations of LaB sub(6) deposited tungsten are described. The observations are discussed in relation to the field electron emission microscopy of LaB sub(6)/W system. The paper ends with a few comments on the scope of further study of this or a similar system using the field ion microscopy and the atom probe field ion microscope.
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ISSN:0250-4707