Investigation of omnidirectional reflection band in ZnTe/ZnSe distributed Bragg reflector

We report the characteristics of reflectance spectra of the 15- and 20-period ZnTe/ZnSe distributed Bragg reflector grown on GaAs (001) substrates by molecular beam epitaxy. The reflectance spectra measured at various incident angles and polarizations were investigated by the theoretical curves simu...

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Bibliographic Details
Published inJournal of alloys and compounds Vol. 649; pp. 755 - 759
Main Authors Huang, Ying-Shin, Hu, Sheng-Yao, Lee, Yueh-Chien, Chang, Chung-Cheng, Tiong, Kwong-Kau, Shen, Ji-Lin, Chou, Wu-Ching
Format Journal Article
LanguageEnglish
Published 15.11.2015
Subjects
Bragg reflectors
Mathematical models
Polarization
Reflectance
Reflection
Spectra
Zinc selenides
Zinc tellurides
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Summary:We report the characteristics of reflectance spectra of the 15- and 20-period ZnTe/ZnSe distributed Bragg reflector grown on GaAs (001) substrates by molecular beam epitaxy. The reflectance spectra measured at various incident angles and polarizations were investigated by the theoretical curves simulated using transfer matrix method. The wavelength variation of the refractive indices described by Sellmeier equation and random thickness model were also considered for the interpretation of the experimentally observed curves. An omnidirectional reflection range defined from the edge of incident-angle-dependent reflection band with TE and TM polarizations is about 15 nm. and is consistent with the observed experimental curves. The results showed that the selected ZnTe and ZnSe materials are suitable for constructing multilayer structures having omnidirectional reflection band.
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ISSN:0925-8388
DOI:10.1016/jjallcom.2015.07.188