Inverse magnetoresistance in textured Fe sub(3)O sub(4) film

A surprising inverse (positive) MR effect was observed in thin film of magnetite (Fe sub(3)O sub(4)) grown on Si substrate by pulsed laser deposition (PLD). Transmission electron microscopy (TEM) and X-ray diffraction (XRD) measurements show a highly (111)-textured growth and single phase nature of...

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Published inJournal of alloys and compounds Vol. 649; pp. 239 - 243
Main Authors Liu, Er, Zhang, Wen, Zheng, Jian-Guo, Hu, Xuefeng, Ou, Huiling, Du, Ruxia, Kou, Chaoxia, Zhai, Ya, Xu, Qingyu, Du, Jun, Xu, Yongbing, Zhai, Hongru
Format Journal Article
LanguageEnglish
Published 15.11.2015
Subjects
Alloys
Atomic force microscopy
Dichroism
Inverse
Silicon substrates
Thin films
Transmission electron microscopy
X-rays
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Summary:A surprising inverse (positive) MR effect was observed in thin film of magnetite (Fe sub(3)O sub(4)) grown on Si substrate by pulsed laser deposition (PLD). Transmission electron microscopy (TEM) and X-ray diffraction (XRD) measurements show a highly (111)-textured growth and single phase nature of Fe sub(3)O sub(4) thin film. X-Ray Magnetic Circular Dichroism (XMCD) and X-ray absorption spectroscopy (XAS) were employed to exclude the existence of gamma -Fe sub(2)O sub(3). The surface morphology of the film was investigated by atomic force microscopy (AFM). Based on the aforementioned studies, we proposed a spin dependent conduction mechanism to explain the observed anomalous MR effect.
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ISSN:0925-8388
DOI:10.1016/j.jallcom.2015.07.108