Persistent insulator-to-metal transition of a VO sub(2) thin film induced by soft X-ray irradiation
We present a persistent soft-X-ray-induced insulator-to-metal transition at room temperature for VO sub(2) thin films. Continuous soft X-ray irradiation renders the insulating electronic state metallic in the VO sub(2) thin films, which has been found by photoemission spectroscopy measurement. The o...
Saved in:
Published in | Japanese Journal of Applied Physics Vol. 53; no. 5S1; pp. 05FB09 - 1-05FB09-4 |
---|---|
Main Authors | , , , , , , , |
Format | Journal Article |
Language | English |
Published |
01.01.2014
|
Subjects | |
Online Access | Get full text |
Cover
Loading…
Summary: | We present a persistent soft-X-ray-induced insulator-to-metal transition at room temperature for VO sub(2) thin films. Continuous soft X-ray irradiation renders the insulating electronic state metallic in the VO sub(2) thin films, which has been found by photoemission spectroscopy measurement. The observed transition is irreversible and the metallic state persists when soft X-ray irradiation is stopped. The analysis of valence band spectra reveals that the density of states (DOS) of the V 3d band increases with irradiation time, while the DOS of the O 2p band decreases. We propose a simple model where the persistent insulator-to-metal transition is driven by oxygen desorption from VO sub(2) thin films under soft X-ray irradiation. The present results will help in developing a new route for controlling the phase transition of VO sub(2) by light. |
---|---|
Bibliography: | ObjectType-Article-1 SourceType-Scholarly Journals-1 content type line 23 ObjectType-Feature-2 |
ISSN: | 0021-4922 1347-4065 |
DOI: | 10.7567/JJAP.53.05FB09 |