Evaluation of C sub(60) secondary ion mass spectrometry for the chemical analysis and imaging of fingerprints

The feasibility of using C sub(60) super(+) cluster primary ion bombardment secondary ion mass spectrometry (C sub(60) super(+) SIMS) for the analysis of the chemical composition of fingerprints is evaluated. It was found that C sub(60) super(+) SIMS could be used to detect and image the spatial loc...

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Bibliographic Details
Published inForensic science international Vol. 231; no. 1-3; pp. 263 - 269
Main Authors Sisco, Edward, Demoranville, Leonard T, Gillen, Greg
Format Journal Article
LanguageEnglish
Published 01.09.2013
Subjects
Buckminsterfullerene
Chemical analysis
Fingerprints
Fullerenes
Image detection
Ion bombardment
Monitors
Secondary ion mass spectrometry
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Summary:The feasibility of using C sub(60) super(+) cluster primary ion bombardment secondary ion mass spectrometry (C sub(60) super(+) SIMS) for the analysis of the chemical composition of fingerprints is evaluated. It was found that C sub(60) super(+) SIMS could be used to detect and image the spatial localization of a number of sebaceous and eccrine components in fingerprints. These analyses were also found to not be hindered by the use of common latent print powder development techniques. Finally, the ability to monitor the depth distribution of fingerprint constituents was found to be possible - a capability which has not been shown using other chemical imaging techniques. This paper illustrates a number of strengths and potential weaknesses of C sub(60) super(+) SIMS as an additional or complimentary technique for the chemical analysis of fingerprints.
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ISSN:0379-0738
DOI:10.1016/j.forsciint.2013.05.026