Confocal photo-stimulated microspectroscopy (CPSM) - residual stress measurements in Al sub(2)O sub(3) using confocal microscopy

A new technique, confocal photo-stimulated microspectroscopy (CPSM), was used to measure the residual stress of the thermally grown oxide (TGO) on several Al sub(2)O sub(3)-scale forming Ni-based alloys. CPSM provides improved resolution over previous techniques, and has revealed residual stress var...

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Bibliographic Details
Published inScripta metallurgica et materialia Vol. 53; no. 3; pp. 347 - 349
Main Authors Hovis, D B, Heuer, AH
Format Journal Article
LanguageEnglish
Published 01.08.2005
Subjects
Alloys
Aluminum oxide
Confocal
Forming
Microscopy
Nickel base alloys
Residual stress
Thermally grown oxides
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Summary:A new technique, confocal photo-stimulated microspectroscopy (CPSM), was used to measure the residual stress of the thermally grown oxide (TGO) on several Al sub(2)O sub(3)-scale forming Ni-based alloys. CPSM provides improved resolution over previous techniques, and has revealed residual stress variations as large as 3 GPa over 1.5 km.
Bibliography:ObjectType-Article-2
SourceType-Scholarly Journals-1
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ISSN:0956-716X
DOI:10.1016/j.scriptamat.2005.04.016