Design rules for field plate edge termination in SiC Schottky diodes

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Bibliographic Details
Published inIEEE transactions on electron devices Vol. 48; no. 12; p. 2659
Main Authors Tarplee, M.C, Madangarli, V.P, Zhang, Quinchun, Sudarshan, T.S
Format Journal Article
LanguageEnglish
Published New York The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 01.12.2001
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ISSN:0018-9383
1557-9646
DOI:10.1109/16.974686