Guest editorial
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Published in | IEEE transactions on instrumentation and measurement Vol. 50; no. 6; p. 1467 |
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Main Authors | , |
Format | Journal Article |
Language | English |
Published |
New York
The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
01.11.2001
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Online Access | Get full text |
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ISSN: | 0018-9456 1557-9662 |
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DOI: | 10.1109/TIM.2001.982929 |