High-Speed Area-Efficient Hardware Architecture for the Efficient Detection of Faults in a Bit-Parallel Multiplier Utilizing the Polynomial Basis of GF(2m)

• Published in: arXiv.org
• Main Authors: Nabipour, Saeideh, Javidan, Javad
• Format: Paper
• Language: English
• Published: Ithaca Cornell University Library, arXiv.org 26.07.2023
• Subjects: Algorithms; Complexity; Critical path; Digital systems; Error correcting codes; Error correction; Error correction & detection; Error detection; Fault detection; Fields (mathematics); Hardware; Logic circuits; Modules; Multipliers; Parallel operation; Polynomials; Smart cards; Soft errors
• ISSN: 2331-8422

The utilization of finite field multipliers is pervasive in contemporary digital systems, with hardware implementation for bit parallel operation often necessitating millions of logic gates. However, various digital design issues, whether inherent or stemming from soft errors, can result in gate malfunction, ultimately can cause gates to malfunction, which in turn results in incorrect multiplier outputs. Thus, to prevent susceptibility to error, it is imperative to employ a reliable finite field multiplier implementation that boasts a robust fault detection capability. In order to achieve the best fault detection performance for finite field detection performance for finite field multipliers while maintaining a low-complexity implementation, this study proposes a novel fault detection scheme for a recent bit-parallel polynomial basis over GF(2m). The primary concept behind the proposed approach is centered on the implementation of an efficient BCH decoder that utilize Berlekamp-Rumsey-Solomon (BRS) algorithm and Chien-search method to effectively locate errors with minimal delay. The results of our synthesis indicate that our proposed error detection and correction architecture for a 45-bit multiplier with 5-bit errors achieves a 37% and 49% reduction in critical path delay compared to existing designs. Furthermore, a 45-bit multiplicand with five errors has hardware complexity that is only 80%, which is significantly less complex than the most advanced BCH-based fault recognition techniques, such as TMR, Hamming's single error correction, and LDPC-based methods for finite field multiplication which is desirable in constrained applications, such as smart cards, IoT devices, and implantable medical devices.