Edge-based 2D alpha-In2Se3-MoS2 ferroelectric field effect device

Heterostructures based on two dimensional (2D) materials offer the possibility to achieve synergistic functionalities which otherwise remain secluded by their individual counterparts. Herein ferroelectric polarization switching in alpha-In2Se3 has been utilized to engineer multilevel non-volatile co...

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Bibliographic Details
Published inarXiv.org
Main Authors Dutta, Debopriya, Mukherjee, Subhrajit, Uzhansky, Michael, Mohapatra, Pranab K, Ismach, Ariel, Koren, Elad
Format Paper
LanguageEnglish
Published Ithaca Cornell University Library, arXiv.org 02.01.2023
Subjects
Actuation
Engineers
Extreme values
Ferroelectric materials
Ferroelectricity
Heterostructures
Miniaturization
Molybdenum disulfide
Optoelectronic devices
Polarization
Two dimensional materials
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Summary:Heterostructures based on two dimensional (2D) materials offer the possibility to achieve synergistic functionalities which otherwise remain secluded by their individual counterparts. Herein ferroelectric polarization switching in alpha-In2Se3 has been utilized to engineer multilevel non-volatile conduction states in partially overlapping alpha-In2Se3-MoS2 based ferroelectric semiconducting field effect device. In particular, we demonstrate how the intercoupled ferroelectric nature of alpha-In2Se3 allows to non-volatilely switch between n-i and n-i-n type junction configurations based on a novel edge state actuation mechanism, paving the way for sub-nanometric scale non-volatile device miniaturization. Furthermore the induced asymmetric polarization enables enhanced photogenerated carriers separation resulting in extremely high photoresponse of 1275 AW-1 in the visible range and strong non-volatile modulation of the bright A- and B- excitonic emission channels in the overlaying MoS2 monolayer. Our results show significant potential to harness the switchable polarization in partially overlapping alpha-In2Se3-MoS2 based FeFETs to engineer multimodal non-volatile nanoscale electronic and optoelectronic devices.
ISSN:2331-8422