Stochastic thermodynamic bounds on logical circuit operation

Using a thermodynamically consistent, mesoscopic model for modern complementary metal-oxide-semiconductor transistors, we study an array of logical circuits and explore how their function is constrained by recent thermodynamic uncertainty relations when operating near thermal energies. For a single...

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Bibliographic Details
Published inarXiv.org
Main Authors Helms, Phillip, Chen, Songela W, Limmer, David T
Format Paper
LanguageEnglish
Published Ithaca Cornell University Library, arXiv.org 14.07.2024
Subjects
Circuit design
CMOS
Cycle time
Dissipation
Logic circuits
Thermal energy
Thermodynamics
Tradeoffs
Transistors
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Summary:Using a thermodynamically consistent, mesoscopic model for modern complementary metal-oxide-semiconductor transistors, we study an array of logical circuits and explore how their function is constrained by recent thermodynamic uncertainty relations when operating near thermal energies. For a single NOT gate, we find operating direction-dependent dynamics, and a trade-off between dissipated heat and operation time certainty. For a memory storage device, we find an exponential relationship between the memory retention time and energy required to sustain that memory state. For a clock, we find that the certainty in the cycle time is maximized at biasing voltages near thermal energy, as is the trade-off between this certainty and the heat dissipated per cycle. We identify a control mechanism that can increase the cycle time certainty without an offsetting increase in heat dissipation by working at a resonance condition for the clock. These results provide a framework for assessing thermodynamic costs of realistic computing devices, allowing for circuits to be designed and controlled for thermodynamically optimal operation.
ISSN:2331-8422