Aberration measurement and correction on a large field of view in fluorescence microscopy

The aberrations induced by the sample and/or by the sample holder limit the resolution of optical microscopes. Wavefront correction can be achieved using a deformable mirror with wavefront sensorless optimization algorithms but, despite the complexity of these systems, the level of correction is oft...

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Bibliographic Details
Published inarXiv.org
Main Authors Furieri, Tommaso, Ancora, Daniele, Calisesi, Gianmaria, Morara, Stefano, Bassi, Andrea, Bonora, Stefano
Format Paper
LanguageEnglish
Published Ithaca Cornell University Library, arXiv.org 03.06.2021
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