Aberration measurement and correction on a large field of view in fluorescence microscopy
The aberrations induced by the sample and/or by the sample holder limit the resolution of optical microscopes. Wavefront correction can be achieved using a deformable mirror with wavefront sensorless optimization algorithms but, despite the complexity of these systems, the level of correction is oft...
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Published in | arXiv.org |
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Main Authors | , , , , , |
Format | Paper |
Language | English |
Published |
Ithaca
Cornell University Library, arXiv.org
03.06.2021
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Subjects | |
Online Access | Get full text |
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