A 6800-[Formula Omitted]m2 Resistor-Based Temperature Sensor With ±0.35 °C (3[Formula Omitted]) Inaccuracy in 180-nm CMOS

This paper describes a compact resistor-based temperature sensor that has been realized in a 180-nm CMOS process. It occupies only 6800 [Formula Omitted], thanks to the use of a highly digital voltage-controlled oscillator (VCO)-based phase-domain sigma–delta modulator, whose loop filter consists of...

Full description

Saved in:
Bibliographic Details
Published inIEEE journal of solid-state circuits Vol. 54; no. 10; p. 2649
Main Authors Angevare, Jan A, Makinwa, Kofi A A
Format Journal Article
LanguageEnglish
Published New York The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 01.01.2019
Subjects
Online AccessGet full text

Cover

Loading…
Abstract This paper describes a compact resistor-based temperature sensor that has been realized in a 180-nm CMOS process. It occupies only 6800 [Formula Omitted], thanks to the use of a highly digital voltage-controlled oscillator (VCO)-based phase-domain sigma–delta modulator, whose loop filter consists of a compact digital counter. Despite its small size, the sensor achieves ±0.35 °C (3[Formula Omitted]) inaccuracy from −35 °C to 125 °C. Furthermore, it achieves 0.12 °C (1[Formula Omitted]) resolution at 2.8 kSa/s, which is mainly limited by the time-domain quantization imposed by the counter.
AbstractList This paper describes a compact resistor-based temperature sensor that has been realized in a 180-nm CMOS process. It occupies only 6800 [Formula Omitted], thanks to the use of a highly digital voltage-controlled oscillator (VCO)-based phase-domain sigma–delta modulator, whose loop filter consists of a compact digital counter. Despite its small size, the sensor achieves ±0.35 °C (3[Formula Omitted]) inaccuracy from −35 °C to 125 °C. Furthermore, it achieves 0.12 °C (1[Formula Omitted]) resolution at 2.8 kSa/s, which is mainly limited by the time-domain quantization imposed by the counter.
Author Makinwa, Kofi A A
Angevare, Jan A
Author_xml – sequence: 1
  givenname: Jan
  surname: Angevare
  middlename: A
  fullname: Angevare, Jan A
– sequence: 2
  givenname: Kofi
  surname: Makinwa
  middlename: A A
  fullname: Makinwa, Kofi A A
BookMark eNqNjM1KAzEURoNUcFp9AHcX3Ogi400ysclShxYrSMEpKIiUMI04pZPU_CzEl9JX6JPZhTs3rj4O5_ANycB5Zwk5ZVgyhvryrmnqkiPTJdecVRIPSMGkVJSNxdOAFIhMUc0Rj8gwxvUeq0qxgnxew5VCpM9TH_q8MTDvu5Ts6qXn8GBjF5MP9MZEu4KF7bc2mJSDhca66AM8dukNdt9YCgm7rxrOxZ-fC5g507Y5mPYDOgdMIXU91Pfz5pgcvppNtCe_OyJn08mivqXb4N-zjWm59jm4vVpyrtUYpVJC_K_6AaMuVHI
ContentType Journal Article
Copyright Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019
Copyright_xml – notice: Copyright The Institute of Electrical and Electronics Engineers, Inc. (IEEE) 2019
DBID 7SP
8FD
L7M
DOI 10.1109/JSSC.2019.2921450
DatabaseName Electronics & Communications Abstracts
Technology Research Database
Advanced Technologies Database with Aerospace
DatabaseTitle Technology Research Database
Electronics & Communications Abstracts
Advanced Technologies Database with Aerospace
DatabaseTitleList Technology Research Database
DeliveryMethod fulltext_linktorsrc
Discipline Engineering
EISSN 1558-173X
GroupedDBID -~X
.DC
0R~
29I
4.4
5GY
6IK
7SP
8FD
97E
AAJGR
AASAJ
ABQJQ
ACGFS
ACIWK
ACNCT
AENEX
AKJIK
ALMA_UNASSIGNED_HOLDINGS
ATWAV
BEFXN
BFFAM
BGNUA
BKEBE
BPEOZ
CS3
DU5
EBS
EJD
F5P
HZ~
IFIPE
IPLJI
JAVBF
L7M
LAI
M43
O9-
OCL
P2P
PZZ
RIA
RIE
RNS
TAE
TN5
ID FETCH-proquest_journals_22987058833
ISSN 0018-9200
IngestDate Fri Sep 13 06:05:54 EDT 2024
IsPeerReviewed true
IsScholarly true
Issue 10
Language English
LinkModel OpenURL
MergedId FETCHMERGED-proquest_journals_22987058833
PQID 2298705883
PQPubID 85482
ParticipantIDs proquest_journals_2298705883
PublicationCentury 2000
PublicationDate 20190101
PublicationDateYYYYMMDD 2019-01-01
PublicationDate_xml – month: 01
  year: 2019
  text: 20190101
  day: 01
PublicationDecade 2010
PublicationPlace New York
PublicationPlace_xml – name: New York
PublicationTitle IEEE journal of solid-state circuits
PublicationYear 2019
Publisher The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher_xml – name: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
SSID ssj0014481
Score 4.633769
Snippet This paper describes a compact resistor-based temperature sensor that has been realized in a 180-nm CMOS process. It occupies only 6800 [Formula Omitted],...
SourceID proquest
SourceType Aggregation Database
StartPage 2649
SubjectTerms CMOS
Sensors
Temperature sensors
Voltage controlled oscillators
Title A 6800-[Formula Omitted]m2 Resistor-Based Temperature Sensor With ±0.35 °C (3[Formula Omitted]) Inaccuracy in 180-nm CMOS
URI https://www.proquest.com/docview/2298705883/abstract/
Volume 54
hasFullText 1
inHoldings 1
isFullTextHit
isPrint
link http://utb.summon.serialssolutions.com/2.0.0/link/0/eLvHCXMwnV3battAEF3c9KV9KEkvNG0aFlpDi1Aqy9q19CgrNqmJ4wcrYCjFrGS5FdQbsKUU2p9qf8Fflpldea3gENq-CCHDSmiOz1y0c4aQd-CRmfCZB-znc9ubwX9OJC1mMyaEn7Rd4XWwUXh4wc8uvcGETRqNdW3XUlkkJ-nPO_tK_seqcA3sil2y_2BZsyhcgHOwLxzBwnD8KxuHFodIzG6ybh9Cz_K7sEaLvMD6JTtduFiaVyIgdhdc1cyKMwiRtYQyUIRcXS2BE4pvVjNym13Mq5k-dSIMO9t3ropFhE9SpGm5xDnxubRavmPLhRUNR-N6oItJZF2WAl5EPrNV-5KV5su0zAsTzYfya3YtdDF8AHxjQDXEUVk_dNMavCggsbBepcDGqFtViljtBK3tfuipIT9GEKFnZv6sjBCjYUkVa8NTb2ojFZW3gKm1zCk4soq9GaTEHTVg2NC71qjewNipkzXXaqm7XkSJsA7G4wj3_gUnboB67s7WZW62CVyMpv3L8_Np3JvED8hDtxOwju4hNF-yIP3VUxurx62-rMMtPu7cYCceUEFOvE-eVNkJDTXUDkgjk0_J45pm5TPyK6QKdJ8rcNAKHF8WLr0NOFoDHNWAowg4uv6DYKPr3xF9395Z5wPdAozmkmqAUQTYc_K234ujM3vz_NMKYaup6wbgExgOtX5B9uSVzF4SmgSB58xbTHhzxxM89TkkrvMM3AvjM87ZITm6b6VX9__8mjzaYvCI7BXLMnsDsWORHCvj3AAwkWvD
link.rule.ids 315,786,790,27957,27958
linkProvider IEEE
openUrl ctx_ver=Z39.88-2004&ctx_enc=info%3Aofi%2Fenc%3AUTF-8&rfr_id=info%3Asid%2Fsummon.serialssolutions.com&rft_val_fmt=info%3Aofi%2Ffmt%3Akev%3Amtx%3Ajournal&rft.genre=article&rft.atitle=A+6800-%5BFormula+Omitted%5Dm2+Resistor-Based+Temperature+Sensor+With+%C2%B10.35+%C2%B0C+%283%5BFormula+Omitted%5D%29+Inaccuracy+in+180-nm+CMOS&rft.jtitle=IEEE+journal+of+solid-state+circuits&rft.au=Angevare%2C+Jan+A&rft.au=Makinwa%2C+Kofi+A+A&rft.date=2019-01-01&rft.pub=The+Institute+of+Electrical+and+Electronics+Engineers%2C+Inc.+%28IEEE%29&rft.issn=0018-9200&rft.eissn=1558-173X&rft.volume=54&rft.issue=10&rft.spage=2649&rft_id=info:doi/10.1109%2FJSSC.2019.2921450&rft.externalDBID=NO_FULL_TEXT
thumbnail_l http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/lc.gif&issn=0018-9200&client=summon
thumbnail_m http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/mc.gif&issn=0018-9200&client=summon
thumbnail_s http://covers-cdn.summon.serialssolutions.com/index.aspx?isbn=/sc.gif&issn=0018-9200&client=summon