Void region segmentation in ball grid array using u-net approach and synthetic data

• Published in: arXiv.org
• Main Authors: Neeluru, Vijay Kumar, Ahuja, Vikas
• Format: Paper
• Language: English
• Published: Ithaca Cornell University Library, arXiv.org 07.07.2019
• Subjects: Ball grid packaging; Circuits; Computer vision; Datasets; Electronic circuits; Image detection; Image quality; Image segmentation; Inspection; Machine learning; Soldering; Synthetic data
• ISSN: 2331-8422

The quality inspection of solder balls by detecting and measuring the void is important to improve the board yield issues in electronic circuits. In general, the inspection is carried out manually, based on 2D or 3D X-ray images. For high quality inspection, it is difficult to detect and measure voids accurately with high repeatability through the manual inspection and the process is time consuming. In need of high quality and fast inspection, various approaches were proposed, but, due to the various challenges like vias, reflections from the plating or vias, inconsistent lighting, noise and void-like artifacts makes these approaches difficult to work in all these challenging conditions. In recent times, deep learning approaches are providing the outstanding accuracy in various computer vision tasks. Considering the need of high quality and fast inspection, in this paper, we applied U-Net to segment the void regions in soldering balls. As it is difficult to get the annotated dataset covering all the variations of void, we proposed an approach to generated the synthetic dataset. The proposed approach is able to segment the voids and can be easily scaled to various electronic products.