Tailoring Vanadium Dioxide Film Orientation using Nanosheets: A Combined Microscopy, Diffraction, Transport and Soft X-ray in Transmission Study

VO2 is a much-discussed material for oxide electronics and neuromorphic computing applications. Here, heteroepitaxy of vanadium dioxide (VO2) was realized on top of oxide nanosheets that cover either the amorphous silicon dioxide surfaces of Si substrates or X-ray transparent silicon nitride membran...

Full description

Saved in:
Bibliographic Details
Published inarXiv.org
Main Authors Phu Tran Phong Le, Hofhuis, Kevin, Rana, Abhi, Huijben, Mark, Hilgenkamp, Hans, Rijnders, G, A ten Elshof, Koster, Gertjan, Gauquelin, Nicolas, Lumbeeck, Gunnar, Schlüßler-Langeheine, Christian, Popescu, Horia, tuna, F, Smit, Steef, Verbeek, Xanthe H, Araizi-Kanoutas, Georgios, Mishra, Shrawan, Vakivskyi, Igor, Durr, Hermann A, Golden, Mark S
Format Paper
LanguageEnglish
Published Ithaca Cornell University Library, arXiv.org 25.01.2019
Subjects
Amorphous silicon
Crystal structure
Crystallography
Electron backscatter diffraction
Insulators
Mapping
Metal-insulator transition
Nanosheets
Orientation
Oxygen consumption
Silicon dioxide
Silicon nitride
Silicon substrates
Single crystals
Soft x rays
Temperature dependence
Thin films
Vanadium dioxide
X ray absorption
X-ray diffraction
X-rays
Online AccessGet full text

Cover

More Information
Summary:VO2 is a much-discussed material for oxide electronics and neuromorphic computing applications. Here, heteroepitaxy of vanadium dioxide (VO2) was realized on top of oxide nanosheets that cover either the amorphous silicon dioxide surfaces of Si substrates or X-ray transparent silicon nitride membranes. The out-of-plane orientation of the VO2 thin films was controlled at will between (011)M1/(110)R and (-402)M1/(002)R by coating the bulk substrates with Ti0.87O2 and NbWO6 nanosheets, respectively, prior to VO2 growth. Temperature dependent X-ray diffraction and automated crystal orientation mapping in microprobe TEM mode (ACOM-TEM) characterized the high phase purity, the crystallographic and orientational properties of the VO2 films. Transport measurements and soft X-ray absorption in transmission are used to probe the VO2 metal-insulator transition, showing results of a quality equal to those from epitaxial films on bulk single-crystal substrates. Successful local manipulation of two different VO2 orientations on a single substrate is demonstrated using VO2 grown on lithographically-patterned lines of Ti0.87O2 and NbWO6 nanosheets investigated by electron backscatter diffraction. Finally, the excellent suitability of these nanosheet-templated VO2 films for advanced lensless imaging of the metal-insulator transition using coherent soft X-rays is discussed.
ISSN:2331-8422