Electrical conduction of silicon oxide containing silicon quantum dots

• Published in: arXiv.org
• Main Authors: Pi, X D, Zalloum, O H Y, Knights, A P, Mascher, P, Simpson, P J
• Format: Paper
• Language: English
• Published: Ithaca Cornell University Library, arXiv.org 03.04.2006
• Subjects: Annealing; Cyclotron resonance; Electric fields; Electrical conduction; Electrical measurement; Electron tunneling; Organic chemistry; Oxide coatings; Plasma enhanced chemical vapor deposition; Quantum dots; Silicon oxides
• ISSN: 2331-8422
• DOI: 10.48550/arxiv.0604028

Current-voltage measurements have been made at room temperature on a Si-rich silicon oxide film deposited via Electron-Cyclotron Resonance Plasma Enhanced Chemical Vapor Deposition (ECR-PECVD) and annealed at 750 - 1000\( ^\circ\)C. The thickness of oxide between Si quantum dots embedded in the film increases with the increase of annealing temperature. This leads to the decrease of current density as the annealing temperature is increased. Assuming the Fowler-Nordheim tunneling mechanism in large electric fields, we obtain an effective barrier height \(\phi_{eff}\) of \(\sim\) 0.7 \(\pm\) 0.1 eV for an electron tunnelling through an oxide layer between Si quantum dots. The Frenkel-Poole effect can also be used to adequately explain the electrical conduction of the film under the influence of large electric fields. We suggest that at room temperature Si quantum dots can be regarded as traps that capture and emit electrons by means of tunneling.